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5075 series VCXO Module IC with Built-in Varicap
OVERVIEW
The 5075 series are miniature VCXO ICs that provide a wide frequency pulling range, even when using miniature crystal units for which a wide pulling range is difficult to provide. They employ a recently developed varicap diode fabrication process that provides a wide frequency pulling range and good linearity without any external components. Also, they employ a regulated voltage drive oscillator circuit that significantly reduces current consumption, crystal current, and oscillation characteristics supply voltage dependency. The 5075 series are ideal for miniature, wide pulling range, low power consumption, VCXO modules.
FEATURES
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VCXO with recently developed varicap diode built-in New fabrication process that significantly reduces parasitic capacitance and provides wide pulling range even when using miniature crystal units Regulated voltage drive oscillator circuit for reduced power consumption, crystal drive current, and oscillation characteristics voltage dependency Wide frequency pulling range * 190ppm (B1 version, f = 27MHz) (Crystal: = 300, C0 = 1.5pF) Operating supply voltage range: 2.25V to 3.63V Oscillation frequency range (for fundamental oscillation): 20MHz to 55MHz (varies with version)
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Low current consumption: 1.0mA (B1 version, f = 27MHz, no load, VDD = 3.3V) Frequency divider built-in * Selectable by version: fO, fO/2, fO/4, fO/8, fO/16 * Frequency divider output for 1.3MHz (min) low frequency output VC pin input resistance: 10M (min) CMOS output Two types of pad layout selectable by mounting method * Ax version: for Flip Chip Bonding * Bx version: for Wire Bonding Package: Wafer form (WF5075xx) Chip form (CF5075xx)
APPLICATIONS
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2.5 x 2.0mm, 3.2 x 2.5mm size miniature VCXO modules for digital mobile TV tuner, digital TV (PDP, LCD), PND (Personal Navigation Device), etc.
ORDERING INFORMATION
Device WF5075xx-4 CF5075xx-4 Package Wafer form Chip form
SEIKO NPC CORPORATION --1
5075 series
SERIES CONFIGURATION
Operating supply voltage range [V] PAD layout Recommended operating frequency range*1 [MHz] 20 to 40 Flip Chip Bonding 40 to 55 2.25 to 3.63 20 to 40 Wire Bonding 40 to 55 5075BJ (5075BK) (5075BL) (5075BM) (5075BN) *1. The recommended operating frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillation frequency range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated. *2. Versions in parentheses ( ) are under development. 5075B1 (5075B2) (5075B3) (5075B4) (5075B5) (5075AJ) (5075AK) (5075AL) (5075AM) (5075AN) Output frequency and version name*2 fO output (5075A1) fO/2 output (5075A2) fO/4 output (5075A3) fO/8 output (5075A4) fO/16 output (5075A5)
VERSION NAME
Device WF5075xx-4 Package Wafer form Version name
WF5075
Form WF: Wafer form CF: Chip (Die) form
-4
Oscillation frequency range, frequency divider function Pad layout type A: for Flip Chip Bonding B: for Wire Bonding
CF5075xx-4
Chip form
SEIKO NPC CORPORATION --2
5075 series
PAD LAYOUT
(Unit: m)
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5075Ax (for Flip Chip Bonding)
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5075Bx (for Wire Bonding)
(420, 345) VSS Y VC
5 6 1 (0,0) 2 4 3
(420, 345) Q Y VDD
5 6 1 (0,0) 2 4 3
Q VDD
VSS VC
(-420, -345)
XT X
XTN
(-420, -345)
XTN X
XT
Chip size: 0.84 x 0.69mm Chip thickness: 130m 15m PAD size: 90m x 90m Chip base: VSS level
Chip size: 0.84 x 0.69mm Chip thickness: 130m 15m PAD size: 90m x 90m Chip base: VSS level
PAD DIMENSIONS
Pad dimensions [m] Pad No. X 1 2 3 4 5 6 -189 189 315 315 -315 -315 Y -240 -240 -21 225 225 -21
PIN DESCRIPTION
Pad No. 5075Ax 1 2 3 4 5 6 5075Bx 2 1 6 5 4 3 Pin XT XTN VDD Q VSS VC I/O I O - O - I Description Crystal connection pin (amplifier input) Crystal connection pin (amplifier output) (+) supply pin Clock output pin (-) supply pin Oscillation frequency control voltage input pin (positive polarity) (frequency increases with increasing voltage)
BLOCK DIAGRAM
Voltage Regulator CIN
Rf
VDD
Oscillation Detector RD COUT Level Shifter
XT
XTN
RVC2
VC
RVC1 CVC1 CVC2
1 N *1
CMOS ouput Buffer
Q
VSS
*1. N = 1, 2, 4, 8, 16
SEIKO NPC CORPORATION --3
5075 series
ABSOLUTE MAXIMUM RATINGS
VSS = 0V
Parameter Supply voltage range Input voltage range Output voltage range Storage temperature range Output current Symbol VDD VIN VOUT TSTG IOUT Conditions Between VDD and VSS Input pins Output pins Wafer form, chip form Q pin Rating -0.5 to 7.0 -0.5 to VDD + 0.5 -0.5 to VDD + 0.5 -65 to +150 20 Unit V V V C mA
RECOMMENDED OPERATING CONDITIONS
VSS = 0V
Rating Parameter Operating supply voltage Input voltage Operating temperature Oscillation frequency*1 Symbol VDD VIN TOPR fO 5075x1 to 5075x5 5075xJ to 5075xN CLOUT 15pF 5075x1 to 5075x5 5075xJ to 5075xN CLOUT 15pF Input pins Conditions Min 2.25 VSS -40 20 40 1.25 2.5 Typ - - - - - - - Max 3.63 VDD +85 40 55 40 55 V V C MHz MHz MHz MHz Unit
Output frequency
fOUT
*1. The oscillation frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillation frequency range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated.
SEIKO NPC CORPORATION --4
5075 series
ELECTRICAL CHARACTERISTICS
5075x1 to 5075x5
VDD = 2.25 to 3.63V, VC = 0.5VDD, VSS = 0V, Ta = -40 to +85C unless otherwise noted.
Rating Parameter Symbol Conditions Min 5075x1 (fO), Measurement circuit 1, no load, fO = 27MHz, fOUT = 27MHz 5075x2 (fO/2), Measurement circuit 1, no load, fO = 27MHz, fOUT = 13.5MHz 5075x3 (fO/4), Measurement circuit 1, no load, fO = 27MHz, fOUT = 6.75MHz 5075x4 (fO/8), Measurement circuit 1, no load, fO = 27MHz, fOUT = 3.38MHz 5075x5 (fO/16), Measurement circuit 1, no load, fO = 27MHz, fOUT = 1.69MHz HIGH-level output voltage LOW-level output voltage Oscillator block built-in resistance VOH VOL RVC1 RVC2 VC = 0.3V CVC1 Oscillator block built-in capacitance CVC2 Design value (a monitor pattern on a wafer is tested), Excluding parasitic capacitance. VC = 1.65V VC = 3.0V VC = 0.3V VC = 1.65V VC = 3.0V VC input resistance VC input impedance VC input capacitance Modulation characteristics*1 RVIN ZVIN CVIN fm Measurement circuit 4, Ta = 25C Measurement circuit 5, VC = 0V, f = 10kHz, Ta = 25C (a monitor pattern on a wafer is tested) Measurement circuit 5, VC = 0V, f = 10kHz, Ta = 25C (a monitor pattern on a wafer is tested) Measurement circuit 6, -3dB frequency, VDD = 3.3V, VC = 3.3Vp-p, Ta = 25C, fO = 27MHz VDD = 2.5V VDD = 3.3V VDD = 2.5V VDD = 3.3V VDD = 2.5V VDD = 3.3V VDD = 2.5V VDD = 3.3V VDD = 2.5V VDD = 3.3V - - - - - - - - - - VDD - 0.4 - 210 Measurement circuit 3 210 - - - - - - 10 - - - 420 5.6 3.1 1.5 8.4 4.7 2.3 - 450 37 25 840 - - - - - - - - - - k pF pF pF pF pF pF M k pF kHz Typ 0.7 1.0 0.6 0.8 0.5 0.7 0.5 0.6 0.4 0.6 - - 420 Max 1.4 2.0 1.2 1.6 1.0 1.4 1.0 1.2 0.8 1.2 - 0.4 840 mA mA mA mA mA mA mA mA mA mA V V k Unit
Current consumption
IDD
Q pin, Measurement circuit 2, IOH = -2.8mA Q pin, Measurement circuit 2, IOL = 2.8mA
*1. The modulation characteristics may vary with the crystal used.
SEIKO NPC CORPORATION --5
5075 series
5075xJ to 5075xN
VDD = 2.25 to 3.63V, VC = 0.5VDD, VSS = 0V, Ta = -40 to +85C unless otherwise noted.
Rating Parameter Symbol Conditions Min 5075xJ (fO), Measurement circuit 1, no load, fO = 48MHz, fOUT = 48MHz 5075xK (fO/2), Measurement circuit 1, no load, fO = 48MHz, fOUT = 24MHz 5075xL (fO/4), Measurement circuit 1, no load, fO = 48MHz, fOUT = 12MHz 5075xM (fO/8), Measurement circuit 1, no load, fO = 48MHz, fOUT = 6MHz 5075xN (fO/16), Measurement circuit 1, no load, fO = 48MHz, fOUT = 3MHz HIGH-level output voltage LOW-level output voltage Oscillator block built-in resistance VOH VOL RVC1 RVC2 VC = 0.3V CVC1 Oscillator block built-in capacitance CVC2 Design value (a monitor pattern on a wafer is tested), Excluding parasitic capacitance. VC = 1.65V VC = 3.0V VC = 0.3V VC = 1.65V VC = 3.0V VC input resistance VC input impedance VC input capacitance Modulation characteristics*1 RVIN ZVIN CVIN fm Measurement circuit 4, Ta = 25C Measurement circuit 5, VC = 0V, f = 10kHz, Ta = 25C (a monitor pattern on a wafer is tested) Measurement circuit 5, VC = 0V, f = 10kHz, Ta = 25C (a monitor pattern on a wafer is tested) Measurement circuit 6, -3dB frequency, VDD = 3.3V, VC = 3.3Vp-p, Ta = 25C, fO = 48MHz VDD = 2.5V VDD = 3.3V VDD = 2.5V VDD = 3.3V VDD = 2.5V VDD = 3.3V VDD = 2.5V VDD = 3.3V VDD = 2.5V VDD = 3.3V - - - - - - - - - - VDD - 0.4 - 210 Measurement circuit 3 210 - - - - - - 10 - - - 420 5.6 3.1 1.5 8.4 4.7 2.3 - 450 37 23 840 - - - - - - - - - - k pF pF pF pF pF pF M k pF kHz Typ 1.2 1.6 0.9 1.3 0.8 1.0 0.7 0.9 0.7 0.9 - - 420 Max 2.4 3.2 1.8 2.6 1.6 2.0 1.4 1.8 1.4 1.8 - 0.4 840 mA mA mA mA mA mA mA mA mA mA V V k Unit
Current consumption
IDD
Q pin, Measurement circuit 2, IOH = -2.8mA Q pin, Measurement circuit 2, IOL = 2.8mA
*1. The modulation characteristics may vary with the crystal used.
SEIKO NPC CORPORATION --6
5075 series
SWITCHING CHARACTERISTICS
VDD = 2.25 to 3.63V, VC = 0.5VDD, VSS = 0V, Ta = -40 to +85C unless otherwise noted.
Rating Parameter Symbol Conditions Min Output rise time Output fall time Output duty cycle tr tf Duty Measurement circuit 7, 0.2VDD 0.8VDD, CLOUT = 15pF Measurement circuit 7, 0.8VDD 0.2VDD, CLOUT = 15pF Measurement circuit 7, Ta = 25C, CLOUT = 15pF, VDD = 3.3V - - 45 Typ 2.1 2.1 50 Max 4.0 4.0 55 ns ns % Unit
Switching Time Measurement Waveform
0.8VDD 0.8VDD
Q
0.2VDD
TW T
0.2VDD
DUTY measurement voltage (0.5VDD) DUTY= TW/ T 100 (%)
tr
tf
SEIKO NPC CORPORATION --7
5075 series
MEASUREMENT CIRCUITS
Measurement Circuit 1
Measurement parameter: IDD
IDD A
Measurement Circuit 4
Measurement parameter: RVIN
VDD
VDD
Crystal
IVIN A
XT XTN RVIN = VDD IVIN
XT
XTN VC
0.1F
Q
VC VSS
VSS
Measurement Circuit 5 Measurement Circuit 2
Measurement parameter: VOH, VOL
VDD XT
Signal Generator
0.001F
XT
Measurement parameter: CVIN, ZVIN
VDD
0.1F 50
Q
XTN
Q
50
XTN VC
VSS
VOH VOL V
0.1F
VS
Impedance Analyzer (HP 4194A)
VC VSS
V VOH VS
VS VOL
VC input signal: 100Hz to 10kHz, 0.1Vp-p
V
Measurement Circuit 6
Measurement parameter: fm
VDD
Crystal
Modulation signal
VS adjusted such that V = 50 x IOH. XT input signal: 1Vp-p, sine wave
VS adjusted such that V = 50 x IOL.
XT
0.1F
Q
XTN R1 VC R2
Measurement Circuit 3
Measurement parameter: RVC1, RVC2
Gain-phase Analyzer (HP 4194A) Modulaiton Analyzer (HP 8901B)
C1
VSS
CLOUT = 15pF
Demodulation signal
IXT A XT XTN VC
VDD
IXTN A XT XTN VC
VDD
C1 = 33F, R1 = R2 = 1M VC modulation signal: 100Hz to 100kHz, 0 to VDDp-p
Measurement Circuit 7
VSS
VSS
Measurement parameter: Duty, tr , tf
RVC1 =
VDD IXT
RVC2 =
VDD IXTN
Crystal
VDD
XT
XTN VC
0.1F
Q
VSS
CLOUT = 15pF (Including probe capacitance)
SEIKO NPC CORPORATION --8
5075 series
FUNCTIONAL DESCRIPTION
Oscillation Start-up Detector Function
The devices also feature an oscillation start-up detector circuit. This circuit functions to disable the outputs until the oscillation starts. This prevents unstable oscillator output at oscillator start-up when power is applied.
TYPICAL PERFORMANCE (5075B1)
The following characteristics measured using the crystal below. Note that the characteristics will vary with the crystal used.
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Crystal used for measurement
Parameter C0 [pF] (= C0/C1) fO = 27MHz 1.5 300
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Crystal parameters
L1 C1 R1
C0
Frequency Pulling Range
250 200 150 Pulling range [ppm] 100 50 0 -50 -100 -150 -200 -250 0.00 0.25 0.50 0.75 1.00 1.25 1.50 1.75 2.00 2.25 2.50 VC [V] Pulling range [ppm] 250 200 150 100 50 0 -50 -100 -150 -200 -250 0.00 0.30 0.60 0.90 1.20 1.50 1.65 1.80 2.10 2.40 2.70 3.00 3.30 VC [V]
VDD = 2.5V, fOUT = 27MHz, Ta = R.T.
VDD = 3.3V, fOUT = 27MHz, Ta = R.T.
Pulling Sensitivity
250 200 Sensitivity [ppm/V] VDD = 2.5V 150 100 VDD = 3.3V 50 0 0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 3.3 VC [V]
Measurement circuit
VDD
Crystal
XT
XTN VC
0.1F
Q
VSS
CLOUT = 15pF (Including probe capacitance)
VDD = 2.5V, 3.3V, fOUT = 27MHz, Ta = R.T.
SEIKO NPC CORPORATION --9
5075 series
Current Consumption
5 4
Measurement circuit
IDD A
VDD
IDD [mA] 3 CLOUT = 15pF 2
Crystal
VC = 0V VC = 0.5VDD VC = VDD
XT
XTN VC
Q
1 CLOUT = No load 2.5 2.8 3.0 VDD [V] 3.3 3.6
VC = 0V VC = 0.5VDD VC = VDD
0.1F
VSS
0
fOUT = 27MHz, Ta = R.T.
Frequency Stability by Supply Voltage Change
3.0 2.0 1.0 f/f [ppm] 0.0 -1.0 -2.0 -3.0 3.0 2.0 1.0 f/f [ppm] 0.0 -1.0 -2.0 -3.0 VC = 3.3V VC = 0V VC = 1.65V
VC = 0V VC = 2.5V VC = 1.25V
2.0
2.5
3.0 VDD [V]
3.5
4.0
2.0
2.5
3.0 VDD [V]
3.5
4.0
fOUT = 27MHz, 0ppm at VDD = 2.5V
fOUT = 27MHz, 0ppm at VDD = 3.3V
Measurement circuit
VDD
Crystal
XT
XTN VC
Q
0.1F
VSS
CLOUT = 15pF (Including probe capacitance)
SEIKO NPC CORPORATION --10
5075 series
Drive Level
30 25
Measurement circuit
VDD
Crystal
XT
0.1F
Drive level [W]
20 15 10 VDD = 3.3V 5 VDD = 2.5V
Tektronix CT-6 Current Probe
XTN IX'tal VC
Q
VSS
CLOUT = 15pF
0 0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 3.3 VC [V]
VDD = 2.5V, 3.3V, fOUT = 27MHz, Ta = R.T.
DL = (IX'tal)2 x Re DL: drive level IX'tal: current flowing to crystal (RMS value) Re: crystal effective resistance
Negative Resistance
Frequency [MHz] 25 30 35 Frequency [MHz] 25 30 35
15 0
20
40
45
15 0 VC = 0V
20
40
45
Negative resistance []
VC = 0V Negative resistance [] -200 VC = 1.65V VC = 3.3V
-200
VC = 1.25V VC = 2.5V
-400
-400
-600
-600
-800
-800
VDD = 2.5V, C0 = 2pF, Ta = R.T.
VDD = 3.3V, C0 = 2pF, Ta = R.T.
Measurement circuit
Network Analyzer (Agilent 4396B) S-Parameter Test Set (Agilent 85046A)
C0 = 2pF
VDD
XT
0.1F
XTN VC
Q
VSS
Note. "C0" value is set, concerning the actual crystal characteristics connected between XT and XTN. The data is measured with Agilent 4396B using NPC's original measurement jig. The values may vary with measurement jig and conditions.
SEIKO NPC CORPORATION --11
5075 series
Phase Noise
-60 -80 -100 -120 -140 -160 10 -60 -80 -100 -120 -140 -160 10
Phase noise [dBc/Hz]
Phase noise [dBc/Hz]
VC = 2.5V VC = 1.25V VC = 0V 100 1,000 10,000 100,000 1,000,000 10,000,000 Offset Frequency [Hz]
VC = 3.3V VC = 1.65V VC = 0V 100 1,000 10,000 100,000 1,000,000 10,000,000 Offset Frequency [Hz]
VDD = 2.5V, fOUT = 27MHz, Ta = R.T.
VDD = 3.3V, fOUT = 27MHz, Ta = R.T.
Measurement circuit
VDD
Crystal
XT
0.1F 200
Q
XTN VC
0.01F
Signal Source Analyzer (Agilent E5052A)
VSS
CLOUT = 15pF
SEIKO NPC CORPORATION --12
5075 series
Modulation Characteristics
3 0 -3 -6 -9 -12 3 0 -3 -6 -9 -12
fm [dB]
0
1
10 Frequency [kHz]
100
1000
fm [dB]
0
1
10 Frequency [kHz]
100
1000
VDD = 2.5V, fOUT = 27MHz, Ta = R.T.
VDD = 3.3V, fOUT = 27MHz, Ta = R.T.
Measurement circuit
VDD
Crystal
Modulation signal
XT
0.1F
Q
XTN R1 VC R2
Gain-phase Analyzer (HP 4194A) Modulaiton Analyzer (HP 8901B)
C1
VSS
CLOUT = 15pF
Demodulation signal
C1 = 33F, R1 = R2 = 1M VC modulation signal: 100Hz to 100kHz, 0 to VDDp-p
Output Waveform
Measurement equipment: Oscilloscope; DSO80604B (Agilent) Measurement circuit
VDD = 3.3V VDD = 2.5V
VDD
Crystal
XT
XTN VC
0.1F
Q
VSS
CLOUT = 15pF (Including probe capacitance)
VDD = 2.5V, 3.3V, fOUT = 27MHz, VC = 0.5VDD, CLOUT = 15pF, Ta = R.T.
SEIKO NPC CORPORATION --13
5075 series
Please pay your attention to the following points at time of using the products shown in this document. The products shown in this document (hereinafter "Products") are not intended to be used for the apparatus that exerts harmful influence on human lives due to the defects, failure or malfunction of the Products. Customers are requested to obtain prior written agreement for such use from SEIKO NPC CORPORATION (hereinafter "NPC"). Customers shall be solely responsible for, and indemnify and hold NPC free and harmless from, any and all claims, damages, losses, expenses or lawsuits, due to such use without such agreement. NPC reserves the right to change the specifications of the Products in order to improve the characteristic or reliability thereof. NPC makes no claim or warranty that the contents described in this document dose not infringe any intellectual property right or other similar right owned by third parties. Therefore, NPC shall not be responsible for such problems, even if the use is in accordance with the descriptions provided in this document. Any descriptions including applications, circuits, and the parameters of the Products in this document are for reference to use the Products, and shall not be guaranteed free from defect, inapplicability to the design for the mass-production products without further testing or modification. Customers are requested not to export or re-export, directly or indirectly, the Products to any country or any entity not in compliance with or in violation of the national export administration laws, treaties, orders and regulations. Customers are requested appropriately take steps to obtain required permissions or approvals from appropriate government agencies.
SEIKO NPC CORPORATION
15-6, Nihombashi-kabutocho, Chuo-ku, Tokyo 103-0026, Japan Telephone: +81-3-6667-6601 Facsimile: +81-3-6667-6611 http://www.npc.co.jp/ Email: sales@npc.co.jp
NC0810AE 2009.02
SEIKO NPC CORPORATION --14

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